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EVENT NEWS
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Services

Services

Services

NAL supports the analytical services for various sectors such as private sectors, universities and research centers.

(a) Implementation of Regional Development

NAL has been cooperating in water quality testing of water resources, research and innovation from universities under Ministry of Education, small and medium enterprise (SME), private sectors, environmental sectors, food safety sectors, quality control of goods and construction materials.

(b) Public Sector

NAL has been providing as a reference laboratory to analyze samples of imported chemicals and related substances by the central leading board of prevention of hazardous chemicals and related substances.

Currently, NAL conducts as PT organizer for the laboratories from other ministries. Human resources development training has been carried out and also analytical parameters for every aspect have been extended.

NAL is trying to be an International recognized ISO/IEC-17025 laboratory. After that, NAL will conduct as PT provider for other Laboratories.

Focus areas

1. Analysis of Samples concerning about prevention of hazardous from chemical and related substances

NAL has been providing as a reference laboratory for the central leading board of prevention of hazardous chemical and related substances.

Analyzing Parameter Instruments
Identification of Compounds …oxides,…carbonate,…hydroxide,….phosphate,…sulfide,….nitride,…chloride,….carbide,…silicate,…suicide,…hydrate,…nitride,…fluoride.etc XRD
Elemental Analysis (Qualitative & Quantitative) Li, B, N, F, Ne, Na, Mg, Al, Si, P, S, Cl, Ar, K, Ca, Sc, Ti, V,Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Kr, Rb, Sr, Y, Zr, Nb, Mo, Pc, Au, Rh, Pd, Ag, Cd, In, Sn, Sb, Pe, I, Xe, Cs, Ba, La, Hf, Ta, W, Re, Os, Ir, Pt, Au, Hg, Tl, Tb, Bi, Po, At, Rn, Fr, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dv, Ho, Er, Tm, Yb, Lu, Th, Pa, U ( sub ppm to 100%) XRF

AAS

ICP-OES

ICP-MS

Identification of Chemical Compounds

(Qualitative)

Various types of organic compounds FTIR-NIR

UV-Vis-NIR

Determination of Moisture Content Moisture (%) Moisture Analyzer and Balance

2.Materials Characterization of Minerals (Ores, Gem stones, Soils, Sediment, etc. )

Analyzing Parameter Instruments
Compounds Identification Quartz (SiO2), Calcite (CaCO3),  Albite (NaAlSi3O8), Kaolinite (Al2Si2O5(OH)4),  Corumdum (Al2O3), Brownmillerite(CaFeAlO5),  Gismondine (CaAl2Si2O8), Chalcocite (Cu2S),  Stromeyerite (AgCuS),Beryl (Be3Al2Si6O18), Hematite(Fe2O3)-etc., XRD
Determination of Crystal Structures Cubic,  Tetragonal, Orthorhombic, Hexagonal,

Trigonal, Triclinic, Monoclinic

XRD
Elemental Analysis

 

Li, B, N, F, Ne, Na, Mg, AL, Si, P, S, Cl, Ar, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Kr, Rb, Sr, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag, Cd ,In, Sn, Sb,Te, I, Xe, Cs, Ba, La, Hf, Ta, W, Re, Os, Ir, Pt, Au, Hg, Tl, Pb, Bi, Po, At, Rn, Fr, C, Ce, Pr, Nd, Pm,  Sm, Eu, Gd, Tb, Dv, Ho, Er, Tm, Yb, Lu, Th, Pa, U

(Sub ppm to 100%)

 

XRF

AAS

ICP-OES

ICP-MS

Micro Imaging of Surface

Elemental Analysis

 

Surface morphology, Topography,  Milling

Deposition and etching

From Na-U

SEM

3.Determination of Metallurgical Materials

(Such as Ores, Alloy, Petroleum Products, Fuels, Bio Fuels, Fossil Fuel, Lubricants, Paints, Laminate, etc..)

Analyzing Parameter Instruments
Flash Point Testing Flash Point Flash Point Tester
Density Density Density Meter
Elemental Analysis (ppm) Carbon, Sulphur

Oxygen, Nitrogen, Hydrogen

C/S Analyzer

O/N/H Analyzer

4(a) Environmental Monitoring

Waste Water, Waste Materials, Air Pollutants, Bio Samples, etc..

Analyzing Parameter Instruments
Chemical Hazards, Composition Li, B, N, F, Ne, Na, Mg, AL, Si, P, S, Cl, Ar, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Kr, Rb, Sr, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag, Cd ,In, Sn, Sb,Te, I, Xe, Cs, Ba, La, Hf, Ta, W, Re, Os, Ir, Pt, Au, Hg, Tl, Pb, Bi, Po, At, Rn, Fr, c,Ce, Pr, Nd, Pm, Sm, Eu, Gd, , Dv, Ho, Er, Tm, Yb, Lu, Th, Pa, U XRF

AAS

ICP-OES

ICP-MS

Thin Film Analysis N, F, Ne, Na, Mg, AL, Si, P, S, Cl, Ar, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Kr, Rb, Sr, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag, Cd ,In, Sn, Sb,Te, I, Xe, Cs, Ba, La, Hf, Ta, W, Re, Os, Ir, Pt, Au, Hg, Tl, Pb, Bi, Po, At, Rn, Fr, c,Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dv, Ho, Er, Tm, Yb, Lu, Th, Pa, U XRF

SEM

 

 

4(b) Environmental Monitoring (Life Science)

Analyzing Parameter Instruments
Microscopic examination Soil Borne Bacteria and

Air Borne Bacteria

AFM

Microscope

Screening on Surface Topography Optical

Scanning

Line profile

3D imaging

AFM

Microscope

Pesticide residues determination Carbamate ,Pesticides, (α- , β-, γ- BHC,  Aldrin, Diedrin,   Endrin, DDT Endosulfan, o,p’DDT,

DDD, Heptachlor)

HPLC – MS

HPLC – UV

GC- MS

5.Various Types of Water Analysis

(Drinking Water, Waste Water, Tube Well, etc…)

Analyzing Parameter Instruments
Examination of Harmful Bacteria Water Borne Bacteria AFM,             Biological Microscope
Elemental Analysis As, Al, Ag, Au, B, Cd, Cr, Cu, Fe, Se, K, Na, Mg, Mn, Mo, Co, Ni, Pb, Li, Zn AAS,                          ICP-OES, ICP-MS
Determination of Pesticide Residues Carbamate Pesticides, α- BHC, β- BHC, γ- BHC, Aldrin, Diedrin,    Endrin,  Endosulfan, o,p’DDT, p,p’DDT,DDD, DDE,Heptachlor HPLC-UV

HPLC-MS

GC –MS

GC-MS (headspace)

Determination of Organic Toxic Benzene,Toluene,  Xylene, MTBE

Ethylbenzene,  Chlorobenzene, Dichloroethane , Chloroform, Tetrachloroethane, Stryene

GC – MS

GC-MS ( headspace)

Properties of Water COD, pH, Phosphate, Nitrate, Conductivity, Total Dissolved Solids, Total Hardness, Dissolved Oxygen, Acidity (total acid), Chloride, Fluoride, UV-Vis-NIR            Ion Chromatography COD Photometer Moisture Analyzer, pH Meter, DO Meter, Alcohol Meter, Phosphate Meter, Nitrate Meter

6.Food Products

Analyzing Parameter Instruments
Examination of Harmful Bacteria Food Borne Bacteria AFM, Biological Microscope
Elemental Analysis As, Al, Ag, Au, B, Cd, Cr, Cu, Fe, Se, K, Na, Mg, Mn, Mo, Co, Ni, Pb, Li, Zn AAS,ICP-OES, ICP-MS
Moisture Content Moisture (%) Moisture Analyzer
Determination of Pesticide Residues α- BHC, β- BHC, γ- BHC, Aldrin,

Diedrin, Endrin,  Endosulfan,

o,p’DDT,p,p’DDT, DDD, DDE,

Heptachlor

GC- MS

FTIR-NIR

Determination & Identification of cancernogenic compounds Chrysene , Perylene GC- MS

FTIR-NIR

Identification of Hazardous Chemical Caffeine, Non volatile organic compounds such as mycotoxins, additive,  preservatives, vitamins,  fatty acids, etc., HPLC-UV/MS

FTIR-NIR

UV-Vis-NIR

7.Pharmaceutical and Cosmetics

(Pharmacy, Cosmetics, Herbal, Fruits and Essential Oils)

Analyzing Parameter Instruments
Examination of Harmful Bacteria Allergic Bacteria AFM, Biological Microscope
Elemental Analysis As, Al, Ag, Au, B, Cd, Cr, Cu, Fe, Se, K, Na, Mg, Mn, Mo, Co, Ni, Pb, Li, Zn AAS,

ICP-OES,

ICP-MS

Quantitative Analysis Organic Compounds Various types of organic compounds FTIR-NIR
Properties of Chemical Compounds Melting Points, Heats of Reaction, Glass Transition, and Heat Capacity. DSC

STA

8.Non Destructive Testing for factories, Buildings and Accessories

Welding Joints, Machine Bodies,, Kilns, Pressure Vessel, Oil and Gas Pipe Line, Components of Vehicles, Trains, Ship & Planes, Products made by composite, Carbon fibre, New Products and Buildings have being tested by Non Destructive Techniques.

Analyzing Parameter Instruments
Testing and Examination of defects in line with relevant codes and standards -Cracks

-Lack of Fusion

-Porosities

-Slack/Oxide/

Tungsten Inclusion

-Lack of Penetration

-Internal or Root Undercut

-External or Crown Undercut

-Offset or Missmatch

-Excess Weld Reinforcement

-Root Concavity

-Shrinkage Groove

-Laminations

-SENTRY 300

(Co-60 Gamma

Projector) (RT)

-SENTRY 880

(Ir -192 Gamma

Projector)(RT)

-SMART 300 HP

X ray Generator (RT)

-CP 160B Portable

X ray Generator (RT)

-HDCR 35

IP Scanner (RT)

-ISONIC PA AUT (UT)

-Scorpion (UT Lite) (UT)

-Lizard M8 (ET)

-Riezler MSE 500

-IRIS DVR-5(Visual)

-PARKER DA 1500 (MT)

9.Non Destructive Testing for Industrial Materials

Analyzing Parameter Instruments
Testing and Evaluation of defects  -Surface and Sub Surface Defects Defectoscope EV (ET)
Testing and Evaluation of defects surface

deformations from the

internal flaws

• Delamination

• Debonding

• Separation of structural

components

• Undulation/waving/

wrinkling

• Kissing bonding

• Impact Damage ( BVID )

• Structural anomaly

• Inter- laminar separations

• Crushed Core,

differentiates between

disbonds

• Internal corrosion

• Changes in section and

core splices / bulkheads

DANTEC Q810 Laser Shearography System
Testing and Evaluation of defects for pipe line -Conductivity of Materials

-Automatic Sizing Of Internal Pits In Heat Exchanger Tubing

 

Ect 48 Micro Dock (ET)
– Research for Quality of new products

– Quality and thermal distribution of Heat Insulated walls

– Gas leakage

– Moisture penetration of walls and roofs

Temperature Variation

(Range -20 °C to +650 °C)

Fluke Ti200 Thermal Camera

10.Determination of Construction Materials

Cements, Limestone, Iron bars, Steel, Aluminum, Zinc, Concrete, Ceramic, Clay, Metals & Alloys, Wire, Rubber, Composite, Polymer, Plastic and Glass.

Analyzing Parameter Instruments
Identification of Inorganic Compounds Calcium oxide (lime)( Ca0),

Silicon dioxide (silica)(SiO2),

Aluminum oxide (alumina)(Al2O3), Iron oxide (Fe2O3), Sulfate(SO3),

Tri-calcium aluminate (Ca3Al2O6),

Tetra-calcium aluminoferrite (Ca4Al2Fe2O10),

Belite or dicalcium silicate (Ca2SiO5 ),

Alite or tricalcium silicate (Ca3SiO4),

Sodium oxide (Na2O),

Potassium oxide(K2O), Gypsum(CaSO4.2H2O)

XRD
Elemental Analysis C,O, H, N, F, Ne, Na, Mg, AL, Si, P, S, Cl, Ar, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Kr, Rb, Sr, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag, Cd ,In, Sn, Sb,Te, I, Xe, Cs, Ba, La, Hf, Ta, W, Re, Os, Ir, Pt, Au,

Hg, Tl, Pb, Bi, Po, At, Rn, Fr,

Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dv, Ho, Er, Tm, Yb, Lu, Th, Pa, U

XRF

Arc-Spark OES,

C/S Analyzer O/N/H Analyzer

 

11.Determination of Construction Materials

Analyzing Parameter Instruments
Elemental Analysis Sub ppm to 100 % XRF, Arc-Spark OES, Analyser
Determination of Physical characterization and heat change determination with melting point Melting Points, Heat of reaction, Glass Transition and Heat Capacity FTIR-NIR

UV-Vis-NIR

Microscopy Surface morphology

Topography

Elemental Analysis

SEM

12.Determination of the Quality of Electronic Devices

(Printed Circuit board, Electronic and mechanical modules, Electro-mechanical components, plugs, Semiconductors packaging and interconnect- micro system, Sensors and actuators)

Analyzing Parameter Instruments
Imaging & Cross section analysis

Elemental Analysis

Surface Marphology

Topography

Deposition and Etching

Milling

Failure Analysis

Elemental composition

FE-SEM
Surface Roughness

& 3D image

Screening of failure

Optical

Scanning

Line Profile

3D Imaging

AFM
Testing and Evaluation of sample layer by layer Typical defect during bonding or chipped wires, excess wires, missing wires and ball bonds X-ray CT

(XYLON, Y,

Cougar SMT)

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